Abstract

As demanding the ultrashort bunches for the pump & probe experiments to investigate ultrafast phenomena occurring at atomic size level, the diagnostic tools should be developed to measure. by measuring the electron diffraction pattern directly. We have developed an S-band RF deflecting cavity working on $\mathrm{TM}_{120}$ mode to measure the femto-second bunch duration of electron beam in UED (Ultrafast Electron Diffraction) system at KAERI. In this conference, we will present on design, fabrication and experimental performance of the deflecting cavity. The estimated temporal resolution of RF deflector, operating with the deflecting voltage of 1.5 MV and the drift length of 1.7 m, is 50 fs. The electron beam with 3 MeV and 1.88 pC, electron bunch duration has 67 fs in rms, which is well agreed with the simulation results.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.