Abstract

We have achieved mobilities in excess of 200,000 cm 2 V −1 s −1 at electron densities of ∼2 ×10 11 cm −2 by suspending single layer graphene. Suspension ∼150 nm above a Si/SiO 2 gate electrode and electrical contacts to the graphene was achieved by a combination of electron beam lithography and etching. The specimens were cleaned in situ by employing current-induced heating, directly resulting in a significant improvement of electrical transport. Concomitant with large mobility enhancement, the widths of the characteristic Dirac peaks are reduced by a factor of 10 compared to traditional, nonsuspended devices. This advance should allow for accessing the intrinsic transport properties of graphene.

Highlights

  • We have achieved mobilities in excess of 200,000 cm2V−1s−1 at electron densities of ∼2×1011 cm−2 by suspending single layer graphene

  • The experimental realization of graphene presents tantalizing opportunities to study phenomena ranging from the topological phase resulting in exotic quantum Hall states [1, 2] to the famous Klein paradox – the anomalous tunneling of relativistic particles [3]

  • The exact nature of the scattering that limits the mobility of graphene devices remains unclear, evidence has mounted that interactions with the underlying substrate are largely responsible

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Summary

Introduction

We have achieved mobilities in excess of 200,000 cm2V−1s−1 at electron densities of ∼2×1011 cm−2 by suspending single layer graphene. In this Letter we report the fabrication of electrically contacted suspended graphene and achieve a tenfold improvement in mobility as compared to the best values reported in the literature for traditional devices fabricated on a substrate. We conclude that our fabrication process results in graphene devices suspended ∼150 nm above SiO2 substrate (Fig. 1d).

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