Abstract
We present data demonstrating that junction-mixing scanning tunneling microscopy (JM–STM) can provide simultaneous picosecond time resolution and nanometer spatial resolution. Experiments were performed on an Au surface with a patterned Ti overlayer. Our measurements under ultrahigh vacuum conditions achieve a spatial resolution of 1 nm using the tunneling currents generated by 20 ps voltage transients. The observed contrast in a JM–STM signal is demonstrated to arise entirely from the difference in electronic structure between the Au and Ti surfaces. These results confirm that JM–STM signals originate in the tunnel junction and maintain the atomic-scale spatial resolution inherent in STM.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
