Ultrafast Relaxation of Charge Carriers Induced Switching in Terahertz Metamaterials

Abstract

We demonstrate ultrafast switching of resonant mode in terahertz metamaterials through optical excitation of radiation-damaged silicon placed in the gap of a split-ring resonator. Upon optical excitation, we observe the dynamic transition of the fundamental resonance from ON-to-OFF state on a timescale of 4 picoseconds (ps) and then fast recovery of the resonance to the ON-state within the next 20 ps. Electric field distributions in the metamaterial unit cell derived through numerical simulations clearly support our experimental observations, showing that the high electric field at the resonator gaps, responsible for inductive-capacitive (LC) resonance, completely disappears and switches OFF the resonance after being optically excited. The ultrafast switching of the metamaterial resonance is attributed to the relaxation of the photo-carriers through the defect states of radiation-damaged silicon layer. Such ultrafast material–based active control of metamaterials can lead to the ultrafast terahertz metaphotonic devices.