Abstract

Photodetector (PD) based on axial n-ZnO/p-CuO heterostructure (HS) nanowires (NWs) array was fabricated on Si substrate by using glancing angle deposition (GLAD) technique. The field emission scanning electron microscope (FE-SEM) image shows the formation of a well-aligned and vertical NW structure. A typical high-resolution transmission electron microscope (HR-TEM) image confirms the formation of an axial HS NW consisting of ZnO NW at the top and CuO NW at the bottom. A twofold enhanced photo-absorption was observed for axial n-ZnO/p-CuO HS NW as compared to pristine ZnO NWs. Moreover, X-ray photoelectron spectroscopy (XPS) analysis prove that there is no deviation in electronic state after the formation of HS. The axial n-ZnO/p-CuO HS NW based PD exhibited a very high rectification ratio of 1200, low dark current ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${I}_{d}$ </tex-math></inline-formula> ) of 0.09 nA and an ultrafast photoresponse with rise time and fall time of 0.49 and 0.11 ms, respectively.

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