Abstract

We fabricated Cu(In,Ga)Se2 (CIGS) solar cells with three types of Zn(O,S) buffer layer produced by different techniques: S thermal cracking, chemical bath deposition (CBD), and reactive sputtering. The highest cell efficiency was obtained from the CIGS solar cell with the CBD-Zn(O,S) buffer layer. The solar cell performance is predominantly determined by the population of defect states distributed in the p–n junction and CIGS bulk layer. We utilized the optical pump–terahertz probe (OPTP) spectroscopy to measure the carrier lifetimes governed by the trapping time at defect states and found out short (τs) and long (τl) lifetimes related to the surface defects and Cu vacancy (VCu) defects, respectively. Both τs and τl increased after deposition of a Zn(O,S) layer, which is attributed to the surface curing and the decrease of VCu defect states with the substitution of Zn atoms for VCu, resulting in “ZnCu”. To investigate band alignment at the p–n junction depending on the different buffer types, we measured ...

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