Abstract

We investigate the dynamics of photoexcited carriers in silicon after interband excitation with optical femtosecond pulses by probing intraband transitions with time-delayed THz pulses. The experimental data at various temperatures are compared with numerical, self-consistent solutions of the intraband polarization and Maxwell’s equations. In addition, we deduce the carrier scattering rate from the comparison between experiment and theory.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.