Abstract
Here, we report our newly built table-top ultrafast extreme ultraviolet (EUV) photoemission electron microscope. The coherent ultrafast EUV light is served by a single order harmonic, which is generated by the interaction between the intense 800-nm femtosecond laser and noble gases in the hollow core fiber. The required order of the harmonic is selected out by a single grating in the off-plane mount and focused on the sample in the ultrahigh vacuum chamber of the photoemission electron microscope. Using metal gold and copper samples, the spatial resolution is calibrated to be better than 50nm and the energy resolution is calibrated to be better than 300 meV. This microscope provides an advanced tool for studying electron dynamics covering the full Brillouin zone of solid materials with ultrahigh time, space, and energy resolution.
Highlights
The photoelectric effect refers to the phenomenon in which electrons are emitted from matter after the absorption of photons
Due to the limit of the laser repetition rate utilized in our microscope (10 kHz), the electron created by the extreme ultraviolet (EUV) beam will cause a more serious space charge effect
We have demonstrated a table-top ultrafast extreme ultraviolet photoemission electron microscope, which combines the ultra-high spatial and energy resolution of the photoelectron microscope with the ultra-high temporal resolution of gaseous high-order harmonics
Summary
The photoelectric effect refers to the phenomenon in which electrons are emitted from matter after the absorption of photons. Einstein explained the phenomenon with the equation Ek = hω–Φ, in which Ek is the kinetic energy of the emitted photoelectrons, hω is the energy of the incident photon, and Φ is the sample work function. Based on the photoelectric effect, photoemission spectroscopy can be used to determine the electron binding energies through measuring the kinetic energy of electrons emitted from matter after absorbing photons. Due to the capability of measuring the kinetic energy and angular distribution of the electrons emitted from a sample, angle-resolved photoemission spectroscopy (ARPES) can provide the information related to the electron binding energy and the in-plane crystal momentum. By adding an energy filter, a PEEM microscope has the capability of energy resolution
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