Abstract
Illustration of the ultrafast electron microscopy technique with electrons passing through a tailored DF aperture, consisting of an array of 72 individual apertures. Credit: Dr. Florian Sterl, Sterltech Optics. • Layered inorganic compound, tantalum disulfide, possesses charge-density wave (CDW) phases. • Ultrafast transmission electron microscope (UTEM) can capture this dynamic behavior. • Technique uses an optical laser pulse to modify sample properties while a pulsed electron beam images the changes. • A tailored DF aperture, of an array of 72 individual apertures, cuts out electrons without any useful information. • Technique can image processes on femtosecond timescales with nanometer length scales.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
