Ultrafast dynamic ellipsometry measurements of early time laser ablation of titanium thin films

Abstract

The dynamics of laser ablated titanium thin films are investigated using a recently developed technique that measures time-resolved and one-dimensional spatially-resolved ablation dynamics in a single shot. Ultrafast dynamic ellipsometry, a technique based on space-shifted spectral interferometry, uses the time-dependent frequency of a chirped laser pulse to provide time encoding, allowing the picosecond probing of material dynamics in a single shot. With this technique, the sample is probed at two different incident angles with both s- and p-polarized light, which measures the motion of the material and any change in its complex refractive index. Ultrafast dynamic ellipsometry is applied to study the mechanism of initiation by laser-based optical detonators that employ the ablation of titanium thin films. The resulting data indicate that the titanium is ablated as a fragmented flyer and not as an expanding plasma.