Abstract
We present recent results on the inspection of a first diffraction-limited hard X-ray Kirkpatrick-Baez (KB) mirror pair for the Coherent X-ray Imaging (CXI) instrument at the Linac Coherent Light Source (LCLS). The full KB system - mirrors and holders - was under inspection by use of high resolution slope measuring deflectometry. The tests confirmed that KB mirrors of 350mm aperture length characterized by an outstanding residual figure error of <1 nm rms has been realized. This corresponds to the residual figure slope error of about 0.05µrad rms, unprecedented on such long elliptical mirrors. Additional measurements show the clamping of the mirrors to be a critical step for the final - shape preserving installation of such outstanding optics.
Highlights
We present recent results on the inspection of a first diffractionlimited hard X-ray Kirkpatrick-Baez (KB) mirror pair for the Coherent Xray Imaging (CXI) instrument at the Linac Coherent Light Source (LCLS)
Transport and focusing of photons from a hard X-ray Free Electron Laser (FEL) to an experimental station on a length scale of a few hundred meters is a challenging task as it can result in a significant loss of brilliance and coherence
A careful characterization and calibration of the sensor is mandatory to achieve the required measurement performance [12,13,14]. This type of extremely accurate metrology instrumentation is essential for a detailed characterization of upcoming high performance reflective optical elements like long ultra-flat dynamically bendable mirrors for FEL application [15], diffraction limited focusing optics [16] as well as for the inspection in the mounted state of X-ray optics to guarantee a shape-preserving installation at the beamline
Summary
Transport and focusing of photons from a hard X-ray Free Electron Laser (FEL) to an experimental station on a length scale of a few hundred meters is a challenging task as it can result in a significant loss of brilliance and coherence. A careful characterization and calibration of the sensor is mandatory to achieve the required measurement performance [12,13,14] This type of extremely accurate metrology instrumentation is essential for a detailed characterization of upcoming high performance reflective optical elements like long ultra-flat dynamically bendable mirrors for FEL application [15], diffraction limited focusing optics [16] as well as for the inspection in the mounted state of X-ray optics to guarantee a shape-preserving installation at the beamline. A Kirkpatrick-Baez (KB) focusing pair [20], with both mirrors shaped as plano-elliptical cylinders for the Coherent X-ray Imaging (CXI) instrument at LCLS [21] was measured in the free and mounted states and in their effective working geometry
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