Abstract
Journal Article Ultra High Energy Resolution EELS Mapping using Aberration-corrected Low-voltage STEM Equipped with Monochromator Get access Masaki Mukai, Masaki Mukai JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan Search for other works by this author on: Oxford Academic Google Scholar Shigeyuki Morishita, Shigeyuki Morishita JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan Search for other works by this author on: Oxford Academic Google Scholar Hidetaka Sawada, Hidetaka Sawada JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan Search for other works by this author on: Oxford Academic Google Scholar Kazu Suenaga Kazu Suenaga Nanotube Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Central 5, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 962–963, https://doi.org/10.1017/S1431927616005651 Published: 25 July 2016
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