Abstract
The positron annihilation spectroscopy was employed for characterisation of defects in pure Ti with ultra fine grained (UFG) structure. UFG Ti samples were prepared by two techniques based on severe plastic deformation (SPD): (i) high pressure torsion (HPT) and (ii) equal channel angular pressing (ECAP). Although HPT is the most efficient technique for grain refinement, the size of HPT-deformed specimens is limited. On the other hand, ECAP is less efficient in grain refinement but enables to produce larger samples more suitable for industrial applications. Characterisation of defects by positron annihilation spectroscopy was accompanied by hardness testing in order to monitor the development of mechanical properties of UFG Ti.
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