Abstract

Polarization measurement has been widely used in materials characterization. Conventional polarization analyzers (PA) based on free-space components are often bulky and require a stable platform. Taking advantage of silicon photonics, photonic integrated circuits for PA have been developed recently. In this letter, we propose and demonstrate an ultra-compact PA using a micro-ring modulator (MRM)-assisted interferometer with a chip size of ~0.12mm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> . The fabricated devices show robust performance with measurement accuracy of ±2.3%.

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