Abstract
We have performed grazing incidence neutron small angle scattering using a fan shaped incident beam focused along one dimension. This allows significantly reduced counting times for measurements of lateral correlations parallel to an interface or in a thin film where limited depth resolution is required. We resolve the structure factor of iron inclusions in aluminium oxide and show that the ordering of silica particles deposited on a silicon substrate depends on their size. We report hexagonal packing for 50 nm but not for 200 nm silica spheres deposited by a modified Langmuir-Schaefer method on a silicon substrate. For the 200 nm particles we extract the particles shape from the form factor. Moreover, we report dense packing of the particles spread on a free water surface. We name this method π-GISANS to highlight that it differs from GISANS as it gives lateral information while averaging the in-depth structure.
Highlights
We show that one-dimensional π-GISANS measurements can be done using a divergent incident neutron beam and integrating the detector images along the out-of-plane direction
In this way we get a significant increase in incident-beam intensity but compromise on depth resolution
The method allows straight forward investigations of buried interfaces which cannot be achieved with any microscopy based method. We show that this method works well on the monochromatic, high resolution, neutron reflectometer Super ADAM and resolve the lateral structure of iron inclusions in an aluminum oxide matrix
Summary
We show that one-dimensional π-GISANS measurements can be done using a divergent incident neutron beam and integrating the detector images along the out-of-plane direction. In this way we get a significant increase in incident-beam intensity but compromise on depth resolution. For single films and interfaces this is acceptable.
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