Abstract
The structural, electrical and magnetic properties of ultra-thin La 0.83Sr 0.17MnO 3 (LSMO) films, deposited on NdGaO 3 substrate by using the MOCVD technique, were studied. The film thickness d varied in the range from 4 to 140 nm. X-ray and RHEED measurements demonstrated that the films had a two-phase structure. One phase had an orthorhombic face centred structure ( a = 0.406 nm and c = 0.46 nm), while the other one had a cubic perovskite-like structure with a = 0.388 nm. Low field dc resistance and magnetization vs. temperature dependences were investigated in the temperature range from 5 to 300 K using a conventional four-probe method and a SQUID magnetometer. It was found that the temperature of the resistivity maximum, T m, increases with increasing film thickness and that the value of the Curie temperature T C estimated from the temperature dependence of magnetization is very close to T m. Modelling of the remanent magnetization vs. temperature dependence based on a two-phase model was in agreement with experimental results. This model also explains the T m shift to lower temperatures with decreasing film thickness.
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