Abstract
ZnSe, Zn0.49Cd0.51Se and Zn0.23Cd0.25Mg0.52Se layers grown on Bi2Se3/sapphire (0001) by molecular beam epitaxy (MBE) are characterized by two-dimensional X-ray diffraction. Pole figures are calculated for cubic and hexagonal planes of the (Zn,Cd,Mg)Se family and compared to their expected values. The targeted wurtzite plane was (11-22), while the cubic ones were the (220) and (311). The results show that, under our MBE growth conditions, ZnSe, Zn0.49Cd0.51Se and Zn0.23Cd0.25Mg0.52Se layers prefer to form the hexagonal (wurtzite) phase rather than the cubic one when grown on Bi2Se3/sapphire in (0001) direction. These results have implications for the next generation devices combining semiconductors and topological insulator materials.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.