Abstract
Properties of a new two-crystal sandwich monochromator based on bent-perfect silicon crystals are presented. A high-resolution neutron diffractometer equipped with such Si (1 1 1)-Si (2 2 0) monochromator and dedicated to strain/stress investigations in polycrystalline materials has been built and introduced into routine operation in NPI Řež. Good luminosity of the diffractometer and a sufficiently high-resolution (FWHM of the instrumental Δd/ d-profile can be about 2 × 10 −3at d = 0.2 nm) permit investigations of more reflection profiles significantly improves a reliability of the investigation of both the macro- and microstrains.
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