Abstract

The growth and properties of Eu-induced one-dimensional reconstructions on vicinal Si(1 1 1) surface miscut in the [ 1 ̄ 1 ̄ 2 ] direction have been studied by low energy electron diffraction and scanning tunneling microscope in the submonolayer range. The focus has been attended to the formation of single-domain structures and the influence of preparation parameters on the domain orientation. We have found the critical conditions for the preparation of a variety of Eu-induced single-domain ( n×2) and ( n×1) structures. In addition, a new intermediate phase showing the 9×1 periodicity between 3×2 and 2×1 phases is detected.

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