Abstract
The experimental results and analysis of pulse noise in degraded field plated PIN photodiodes are presented. A method for calculation of noise source parameters based on noise measurements in the time and the frequency domain is proposed.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
