Abstract
Two XUV-photon double ionization of Kr and Ar by an intense superposition of higher-order harmonics of a Ti:sapphire laser is demonstrated. The logarithm of the ${\mathrm{Kr}}^{2+}$ and ${\mathrm{Ar}}^{2+}$ signals measured as a function of the logarithm of the XUV intensity depicts a linear dependence with a slope of $1.8\ifmmode\pm\else\textpm\fi{}0.2$. Under the XUV intensities and photon energies employed, this slope value provides evidence that to the observed double ionization the direct process has a significant contribution. Applications of the above process to attosecond pulse metrology are also discussed.
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