Abstract
The results of using a two-flux model of charged-particle transport in a substance are presented to describe the average energy of a monoenergetic electron beam passed through a film target with known composition and a given thickness. Formulas describing the distribution of the average energy of the electron beam over the target depth and the energy dependence of the electron-beam range for electrons with an energy of 0.1 keV–1.0 MeV are obtained. The results of calculating the electron ranges for a wide range of materials, namely, from Be to Au, are given. The particle ranges calculated using the formulas are compared with the experimental results of measuring the depth of their penetration into the target.
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More From: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
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