Abstract
This paper considers the development and application of a system of reflectometry for the analysis of the homogeneity of structures manufactured by additive technologies. A system of reflectometry based on a backward wave oscillator, a two-dimensional object positioning system and an optoacoustic detector (Goley cell) is described. The results of reflectometry of the hexagonal periodic structure of cells based on acrylonitrile butadiene styrene at a wavelength of 343 microns are presented.
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