Abstract
A rapid acquisition method for two-dimensional (2D) magnetic resonance force microscopy images is described. Spatial resolution is based on gradients in the static magnetic field ${B}_{0}$ and in the applied radiofrequency field ${B}_{1}$. Hadamard- and Fourier-encoding schemes, respectively, are employed to obtain high sensitivity by taking advantage of a maximum multiplex effect. 2D images of a patterned ${({\text{NH}}_{4})}_{2}{\text{SO}}_{4}$ crystal sample are reconstructed from the known field distributions with a resolution of $1\text{ }\ensuremath{\mu}\text{m}$.
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