Abstract
2D-COS–FTIR was used to locate the crystallization-sensitive bands of ion-irradiated poly(ether ether ketone). The band at 1310 cm−1 was the most sensitive band, and the area under this band changed linearly with the degree of crystallization which was obtained from differential scanning calorimetry. The deviation between experimentally determined and calculated degree of crystallization progressively increased at irradiation doses above 20 MGy for proton and helium-irradiated PEEK. This was attributed to different cross-linking mechanism on irradiation with the two different ions. 2D-COS–FTIR spectroscopy is a powerful tool for polymer characterization and helps in the quantitative analysis.
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