Two-dimensional field mapping of monolithic microwave integrated circuits using electrooptic sampling techniques

Abstract

Since the invention of the electrooptic sampling technique about ten years ago, this contactless test technique based on ultra-short optical pulses has become more and more attractive to microwave engineers developing monolithic microwave integrated circuits (MMICs). The electrooptic sampling technique was originally used for circuit internal measurements of very high-speed waveforms only at discrete test points. During the last five years, a new test technique, the two-dimensional electrooptic field mapping technique, has been developed and widely used. This test technique which measures the magnitude and phase of the microwave signal gives information not only of one discrete test point but also of a greater area within the circuit and therefore insight into the microwave field distribution. This two-dimensional electrooptic field mapping technique could be a powerful tool for studying fundamental properties of wave propagation in monolithic integrated microwave devices and circuits. The aim of this paper is to present the state-of-art of this new test technique and to show an example of its application.