Abstract
In this work, we introduce a two color, low intensity photocurrent feedback method for photocurrent spectroscopy utilizing an atomic force microscope (AFM). In most applications, measurements with weak optical excitations are not feasible with an AFM because the powerful AFM feedback laser severely disturbs the measurements. Therefore, we have developed a feedback system based on the pressure dependent Schottky barrier height at the tip-sample interface. The versatility of the new feedback system is demonstrated by recording high resolution photocurrent spectra on GaAsInAs heterostructures.
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