Abstract
Transmission electron microscopy and diffraction have been used in a study of semimagnetic-semiconductor Cd 1 − x Mn x thin films with x ⩽ 0.02 prepared by a hot-wall vacuum evaporation technique on rock-salt substrates. The films had a preferred (001) orientation containing many { 111 } microtwins. Rarely they had a (111) orientation twin related to double positioning structure.
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