Twin support vector machine based on adjustable large margin distribution for pattern classification

Abstract

This paper researches the value of the margin distribution in binary classifier. The central idea of large margin distribution machine (LDM) is to optimize the margin distribution, such as maximizing the margin mean and minimizing the margin variance. Compared to support vector machine (SVM), LDM demonstrates the good generalization performance. In order to improve the generalization performance of twin support vector machine (TSVM), a twin support vector machine based on adjustable large margin distribution (ALD-TSVM) is proposed in this paper. Firstly, the margin distribution is redefined to construct a pair of adjustable supporting hyperplanes. Then, the redefined margin distribution is introduced onto TSVM to obtain the models of ALD-TSVM, including linear case and nonlinear case. ALD-TSVM is a general learning method which can be used in any place where TSVM and LDM can be applied. Finally, the novel method is compared with other classification algorithms by doing experiments on toy dataset, UCI datasets and image datasets. The experimental results show that ALD-TSVM obtains better classification performance.