Abstract
Electron backscatter diffraction (EBSD) is an automated technique that can measure the orientation of crystals in a sample very rapidly. There are many sophisticated software packages that present measured data. Unfortunately, due to crystal symmetry and differences in the set-up of microscope and EBSD software, there may be accuracy issues when linking the crystal orientation to a particular microstructural feature. In this paper we outline a series of conventions used to describe crystal orientations and coordinate systems. These conventions have been used to successfully demonstrate that a consistent frame of reference is used in the sample, unit cell, pole figure and diffraction pattern frames of reference. We establish a coordinate system rooted in measurement of the diffraction pattern and subsequently link this to all other coordinate systems. A fundamental outcome of this analysis is to note that the beamshift coordinate system needs to be precisely defined for consistent 3D microstructure analysis. This is supported through a series of case studies examining particular features of the microscope settings and/or unambiguous crystallographic features. These case studies can be generated easily in most laboratories and represent an opportunity to demonstrate confidence in use of recorded orientation data. Finally, we include a simple software tool, written in both MATLAB® and Python, which the reader can use to compare consistency with their own microscope set-up and which may act as a springboard for further offline analysis.
Highlights
Electron backscatter diffraction (EBSD) is a common laboratory based tool used to measure crystal orientations from crystalline samples
Rapid data acquisition can be performed with on-line orientation analysis which enables capture of highly detailed maps from very large sample areas. This pattern analysis is routinely carried out using sophisticated software algorithms to produce extremely rich data sets that can be interrogated for crystallographic texture, grain orientation, grain shape, and
We focus on establishing a coordinate system for the diffraction pattern and the convention that the Z axis points out of the sample to establish a consistent set of descriptions for the frames of reference, crystal rotations, and the generation of microstructure maps
Summary
Electron backscatter diffraction (EBSD) is a common laboratory based tool used to measure crystal orientations from crystalline samples. Rapid data acquisition (up to 1200 patterns per second) can be performed with on-line orientation analysis which enables capture of highly detailed maps from very large sample areas. This pattern analysis is routinely carried out using sophisticated software algorithms to produce extremely rich data sets that can be interrogated for crystallographic texture, grain orientation, grain shape, and local deformation structure. In the quest for rapid automation and easy to use software tools it can be difficult to accurately describe the various reference frames for sample orientation and crystal orientation with ease This process is repeated for every pattern captured to generate maps for a typical EBSD experiment
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
