Abstract
ABSTRACTA family of metastable [(Bi2Te3)x(TiTe2)y] superlattices (where × and y denote the number of layers of each of the two components) was prepared by annealing modulated elemental reactant precursors at temperatures below 280°C. Structural analysis by traditional XRD shows the superlattice structures are highly aligned to the substrate with many orders of diffraction peaks from the c direction of the superlattice. Off-axis diffraction techniques presented in this paper suggest that the order between the layers in the a-b direction of these superlattice structures is turbostratic. In this type of behavior, the quasi two-dimensional crystals of Bi2Te3 and TiTe2 that comprise the superlattice structure lie like a deck of cards thrown in disarray on a surface. An analysis of the diffraction data leading to this conclusion is given.
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