Abstract
Conductive atomic force microscopy has been utilized to study the charge injectionphenomenon on various materials. We proposed a gentle method for local charge injectionand observation based on self-excitation dynamic-mode atomic force microscopy, whichinvolves switching between amplitude modulation mode for tunnelling charge injection andfrequency modulation modes for surface potential measurement. We demonstrated that themethod was effective in investigating charge injection and dissipation processes withoutserious degradation of the tip and samples. To examine the method we measured goldnanoparticles on an insulator and an isolated pentacene island on a substrate.
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