Abstract
Magnetic force microscopy (MFM) can be done by making a simple change in conventional scanning tunneling microscopy (STM) where the usual rigid STM tip is replaced with a flexible magnetic tip. STM images acquired this way show both the topography and the magnetic forces acting on the flexible tip. The z-motion of the STM piezo tube scanner flexes the tip to balance the magnetic force so that the end of the tip remains a fixed tunneling distance from the sample surface. We present a review of some “tunneling-stabilized” MFM (TSMFM) images showing magnetic bit tracks on a hard disk, Bloch wall domains in garnet films, and flux patterns in high-Tc superconductor films. The image resolution of TSMFM is routinely 0.1 μm using Au coated magnetic tips cut from Ni or Fe films. Recent results show that a TSMFM resolution of less than 40 nm is possible with micromachined cantilevers coated with a very thin Au-Fe bilayer.
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Schedule a callMore From: Proceedings, annual meeting, Electron Microscopy Society of America
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