Abstract
Active metals finely dispersed on oxide supports are useful in a broad class of applications. We have used scanning tunneling microscopy (STM) to characterize and to manipulate 30-50-A rhodium particles grown on TiO 2 (001) rutile. Tunneling barrier height values of ≃5 eV (close to the mean tipsample work function) indicated a good vacuum tunneling gap. The tunneling probe was used to manipulate individual nanoparticles via intimate tipsample point contacts. The results are consistent with cohesive/adhesive tip-particle interactions. This study indicates that supported catalyst and sensor research can be done on a particle-by-particle basis
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