Abstract
The Eliashberg function, α 2(ω)ƒ(ω) , derived from tunneling spectra for amorphous Sn 1− x Cu x thin films (0.08 ≤ x ≤ 0.41) changes qualitatively as well as quantitatively with x . Values of 2Δ/ k BT c,T c and λ decrease while > Ω > increases with x ; μ ∗ = 0.10 ± 0.02 , approximately independent of x .
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