Tuning the optical properties of SnO2/Ag/SnO2 tri-layers by changing Ag thickness

Abstract

In this work, for the first time, the effect of changing Ag thickness on the optical and electrical properties of SnO2/Ag/SnO2 tri-layered films prepared by magnetron sputtering equipped with glancing angle deposition has been investigated. Several parameters such as figure of merit (FOM), sheet resistance, NIR emissivity, and refractive index have been studied for the structure prepared by the different thickness of Ag. It has been found that the sample with thickness of 100 and 25 nm, respectively, for the SnO2 and the Ag layers has the maximum FOM of 44.37 × 10−4 Ω−1, the sheet resistance of 7.53 Ω/sq, average transmittance of 71.18% and NIR emissivity of 0.093 which shows the remarkable impact of the glancing angle deposition technique on the optical and electrical parameters of these structures.