Tuning of exchange bias by regulating the microstructural parameters in Ni81Fe19 (5, 8, 11, 14, 17, and 20 nm)/Ir7Mn93(10 nm) bilayers probed using magnetoresistance

Abstract

The investigation and tunning of positive exchange bias (PEB) and negative exchange bias (NEB) are reported at room temperature (RT) and low temperature (20 K), respectively, in a series of top-pinned Ni81Fe19(tFM = 5, 8, 11, 14, 17, and 20 nm)/Ir7Mn93(10 nm) polycrystalline heterostructure thin films grown in the presence of a 1 kOe in situ magnetic field by systematically controlling the microstructural parameters such as thickness, roughness, and crystallite/grain size. On decreasing the thickness (roughness) of NiFe from 20 nm (0.49 nm) to 5 nm (0.28 nm), an enhancement in PEB and NEB is observed from +12 to +22 Oe and −300 to −556 Oe at RT and 20 K, respectively. It is observed that both exchange bias and coercivity substantially depend on the atomic scale roughness of the interface width (NiFe/IrMn). The representative plane-view of transmission electron microscopy (TEM) measurements revealed the enhanced antiferromagnet (AF) grain size on decreasing the thickness of ferromagnetic, whereas cross-sectional TEM studies exhibited the sharp interfaces in the bilayer samples after magnetic annealing. A unique correlation between the training mechanism and the degree of asymmetry is established. Further, the training measurement data are fitted with various theoretical models that support the fact that not only interfacial but also bulk AF spins play a vital role in the exchange bias. Thus, the present study reveals the microstructural insights by varying the thickness of NiFe to address the unresolved issues of the EB by directly correlating it with interface roughness and the crystallite/grain size of AF in it, probed using the magnetoresistance technique.