Tuning grain-boundary resistances for ReRAM

Abstract

In quest of ultra-nonlinear switching kinetics in ReRAM devices, field-accelerated ion transport in solids has attracted great interest as a potential source of non-linear response. We employed large-scale Molecular Dynamics simulations to explore the impact of external electric fields on the rates of ion transport in ceria. We found that the standard models cannot account for the non-linear high-field regime and instead propose a new analytical model which excellently predicts the behaviour at all field strengths. Focussing on the interplay between electric fields and grain boundaries, we explore the tunability of grain-boundary resistances through applying large electric fields.