Abstract

Off-stoichiometric full-Heusler alloy Co2MnAl thin films with different thicknesses are epitaxially grown on GaAs (001) substrates by molecular-beam epitaxy. The composition of the films, close to Co1.65Mn1.35Al (CMA), is determined by x-ray photoelectron spectroscopy and energy dispersive spectroscopy. Tunable perpendicular magnetic anisotropy (PMA) from 3.41 Merg/cm3 to 1.88 Merg/cm3 with the thickness increasing from 10 nm to 30 nm is found, attributed to the relaxation of residual compressive strain. Moreover, comparing with the ultrathin CoFeB/MgO used in the conventional perpendicular magnetic tunnel junction, the CMA electrode has a higher magnetic thermal stability with more volume involved. The PMA in CMA films is sustainable up to 300°C, compatible with semiconductor techniques. This work provides a possibility for the development of perpendicular magnetized full-Heusler compounds with high thermal stability and spin polarization.

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