Abstract
The characteristic of specifically tunable negative differential resistance (NDR) of single-electron transistor (SET) controlled by capacitance which is noted accidentally in our experiment is studied in this paper. Tunable NDR of SET controlled by single source, drain and gate capacitances are simulated, respectively, then it is also done by controlling more than one capacitance. From the simulation results, it is seen that NDR of SET can be modulated by changing the value of capacitance of SET. Moreover, the cause of the phenomenon of tunable NDR of SET controlled by capacitance is given a qualitative analysis based on macro model.
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