Abstract
The relationship between the surface irregularities and crystallographic structure of thin silver films are investigated as a function of the conditions of film preparation. Information on the film surface is deduced mainly from electron microscope examination of carbon surface replicas, while information on the film structure is obtained by studies of the films themselves by electron microscopy and diffraction as well as X-ray diffraction. The roughness of the Ag-air interface is shown to arise from (a) crystallization defects of Ag ( e.g. twinning), or in some cases, grain boundaries; (b) the roughness of the substrate due to polishing; (c) the slow and gradual sulfuration of Ag. The conditions of preparation are determined for films in which less than 5% of the film surface is perturbed by irregularities with height (as estimated by microstereography) less than 30 or 50 Å.
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