TSDNet: A New Multiscale Texture Surface Defect Detection Model

Abstract

Industrial defect detection methods based on deep learning can reduce the cost of traditional manual quality inspection, improve the accuracy and efficiency of detection, and are widely used in industrial fields. Traditional computer defect detection methods focus on manual features and require a large amount of defect data, which has some limitations. This paper proposes a texture surface defect detection method based on convolutional neural network and wavelet analysis: TSDNet. The approach combines wavelet analysis with patch extraction, which can detect and locate many defects in a complex texture background; a patch extraction method based on random windows is proposed, which can quickly and effectively extract defective patches; and a judgment strategy based on a sliding window is proposed to improve the robustness of CNN. Our method can achieve excellent detection accuracy on DAGM 2007, a micro-surface defect database and KolektorSDD dataset, and can find the defect location accurately. The results show that in the complex texture background, the method can obtain high defect detection accuracy with only a small amount of training data and can accurately locate the defect position.