Truncated pyramid artifact for performance evaluation experiments on laser line scanner

Abstract

Non-contact measurement techniques using 3D laser scanning have the power to deliver tremendous benefits to most notably manufacturing, and have the advantage of high speed and high detail output. However, procedures for evaluation and verification of non-contact laser line scanner have not been well-established because of many influencing factors like scan depth, incident angle, probe head orientation and surface properties. A truncated pyramid artifact representation of five- planar with different included angles was designed and used to straightforwardly identify the influence of in-plane and out-of-plane angle, as well as scan depth on dimensional measurement accuracy of the laser scanner. Then, a series of easy, fast and representative experiments, based on this simple artifact, were performed on a commercial laser line scanner, and found that the output of this scanner can be improved for metrology applications after calibration.