Abstract
In this study, we discuss the relationship between Q factor of the cantilever in various environments and frequency noise in frequency modulation atomic force microscopy (FM-AFM). We first present true-molecular resolution FM-AFM images of alkanethiol self-assembled monolayers taken in a moderate vacuum environment (vacuum pressure: 6 Pa) and in air (cantilever Q factor: 390) using FM-AFM with a low noise cantilever deflection sensor. The results reveal that the minimum Q factor to obtain true-molecular resolution in FM-AFM can be less than a few hundred.
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