Abstract
We present a model which explains the heat-load-associated contrast in X-ray topographs, which can occur when using third-generation high-energy synchrotron radiation sources. The thermal deformation is treated in terms of an angular distortion σπ, which is a function of the absorbed power and the mechanical, thermal and diffraction properties of the sample. We obtain simple, criteria for the exposure time (and/or filtering of the beam) of a topographic experiment, to remain below an allowed maximum distortionδθ max. Experiments performed using either filters or a stroboscopic shutter confirm the validity of the present criteria.
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