Trapping two types of particles with a focused generalized Multi-Gaussian Schell model beam

Abstract

We numerically investigate the trapping effect of the focused generalized Multi-Gaussian Schell model (GMGSM) beam of the first kind which produces dark hollow beam profile at the focal plane. By calculating the radiation forces on the Rayleigh dielectric sphere in the focused GMGSM beam, we show that such beam can trap low-refractive-index particles at the focus, and simultaneously capture high-index particles at different positions of the focal plane. The trapping range and stability depend on the values of the beam index N and the coherence width. Under the same conditions, the low limits of the radius of low-index and high-index particles for stable trapping are indicated to be different.