Abstract
For pt.II see ibid, vol.21, p.5913 (1988). Electron paramagnetic resonance (EPR) and thermally stimulated luminescence (TSL) studies were conducted on gamma -irradiated SrSO4:UO22+ to elucidate the role of electron and hole traps in thermally stimulated reactions and to obtain the trap parameters (the trap depth and frequency factor). For samples annealed at 970 K (samples A), intense hydrogen atom signals were seen in EPR, and it was found that the thermally stimulated reaction between H0 atoms and SO4- is responsible for the luminescence glow at 380 K. In the close vicinity of this temperature, the EPR spectrum of hydrogen exhibited features of chemically induced dynamic nuclear polarisation, suggesting that this reaction proceeds through pair formation. The hydrogen atom intensities were considerably smaller for samples quenched at 1170 K (samples B) but appeared to have participated in the formation of SH2. In both samples A and samples B, a trapped hole centre with g=1.995 formed owing to gamma -irradiation at 300 K. The temperature stability of this crucially depended on the presence of H0 and also SO4u-. The intense glow peak at 420 K present in both samples was identified as due to the reaction between SO4SuS- and UO2+.
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