Abstract

The temperature dependences of the coefficient of the transverse Nernst-Ettingshausen effect in SnTe: In samples with different indium contents (1–16 at %) in the temperature range 100–300 K and the electrical resistivity at temperatures of 1.2–4.2 K and in magnetic fields of up to 10 kOe are investigated. The data obtained indicate the presence of resonant hole scattering into the band of quasi-local In impurity states in Sn1−xInxTe samples with In content x ≥ 0.05 and a superconducting transition with a critical temperature Tc ∼ 1.5–2.2 K. The SnTe: In samples with the degree of filling of impurity states by electrons, which is close to 1/2, and the Fermi level ɛF pinned in the vicinity of the minimum energy dependence of the relaxation time τ(ɛ) are characterized by inhomogeneities of a new type, i.e., inhomogeneities of the scattering parameter r = ϖlnτ/∂lnɛ|\( \varepsilon _F \), which are induced by fluctuations of the degree of filling of quasi-local states by electrons.

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