Abstract
A model for the behaviour of transverse initial susceptibility as a function of dc applied field is developed for the case of thin films exhibiting simultaneous in-plane and perpendicular anisotropy. It is used to deduce in-plane and perpendicular anisotropy fields in a very simple way from transverse susceptibility measurements made by the transverse Kerr effect. The results obtained are cross-checked by those obtained from magnetization curves.
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