Abstract
Peculiarities of magnetic measurements on thin films in a transverse field are discussed. The shielding current distribution is calculated and a well-known few orders discrepancy between calculated and measured penetration field H ∗ is believed to be cleared up. The results for epitaxial (001) and (110) electron-doped HTSC Nd 1.85Ce 0.15CuO 4− x films are presented. The critical current of 0.84 × 10 6 A/cm 2 in a (100) film at 4.2 K from remanent magnetization is derived which indicates a homogeneous behaviour and strong pinning. On the contrary poor shielding and low magnetization in (110) shows its granularity with a weak intergranular coupling.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
